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Winbond(华邦)
country/region:中国台湾
Application:
消费电子工业应用汽车电子5G与通信网络计算机

Winbond Electronics Corporation 是一家存储器 IC 公司,致力于设计、制造和销售服务,向全球客户提供高品质存储器解决方案。 Winbond 的产品线包括代码存储闪存、串行和并行 NAND、特殊 DRAM 和移动 DRAM。Winbond 产品广泛应用于物联网垂直市场领域的各个公司,涵盖计算、多媒体设备、汽车、网络系统和工业市场。 Winbond 向汽车和工业领域提供享有长期支持服务的 Plus 级闪存和 DRAM 产品。 Winbond 在全球拥有约 2,200 名员工,旗下 12 英寸晶圆厂位于中国台湾台中市的公司总部。

Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
Type:PCN
Time:2023-03-03
Change:Test Site
No.:Z200-PCN-TM202303-01-A
Description:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
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