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Winbond(华邦)
国家/区域:Taiwan, China
应用领域:
consumer electronicsIndustrial applicationsAutomotive electronics5G and communication networkscomputer

Winbond Electronics Corporation is a memory IC company that designs, manufactures and sells services to provide high-quality memory solutions to customers around the world. Winbond's product lines include code storage flash, serial and parallel NAND, specialty DRAM and mobile DRAM. Winbond products are used by companies across IoT vertical market segments, including computing, multimedia devices, automotive, network systems and industrial markets. Winbond provides Plus-grade Flash and DRAM products with long-term support to the automotive and industrial sectors. Winbond has approximately 2,200 employees worldwide and its 12-inch wafer fab is located at the company's headquarters in Taichung, Taiwan.

类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
类型:PCN
变更时间:2023-03-03
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
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