变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.
变更类型:Test Site
变更编号:Z200-PCN-TM202303-01-A
变更说明:To add an additional chip probing (CP) testing site Walton for 16Mb with 58nm Flash automotive products.